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  1. what voltages do the power supplies in the digital defensive ATE augmentation equipment (DAAE) power distribution group provide to the functional test groups (FTG)?
    a. 5 VDC, +-28 VDC, and 15 VDC
    b. 4 VDC, 12 VDC, and +-30 VDC
    c. 5 VDC, 12 VDC, and +-15 VDC
    d. +-1 VDC, 12 VDC, and +-28 VDC
    5 VDC, 12 VDC, and +-15 VDC
  2. the digital defensive automatic test equipment (ATE) augmentation equipment (DAAE) functional test group (FTG) that provides the programmed input/output (I/O) scenario and direct memory access for the control interface unit (CIU) line replaceable unit (LRU) is the
    a. test module adapter (TMA)
    b. avionics control unit (ACU)
    c. control interface unit (CIU)
    d. emitter simulator processor (ESP)
    avionics control unit (ACU)
  3. which functional test group (FTG) is used to test the control interface unit (CIU) line replaceable unit (LRU) in conjunction with the CIU FTG?
    a. test module adapter (TMA)
    b. avionics control unit (ACU)
    c. advanced tracking unit (ATU)
    d. emitter simulator processor (ESP)
    avionics control unit (ACU)
  4. the digital defensive automatic test equipment (ATE) augmentation equipment (DAAE) test adapter group (TAG) serves what testing purpose?
    a. digital DAAE selt-test
    b. digital (DIG) test station self-test
    c. test module adapter self-test
    d. DIG test station performance test
    digital DAAE self-test
  5. on the defensive automatic test equipment (ATE) augmentation equipment (DAAE), what wire list includes columns labeled LEVEL 1 GOES TO and LEVEL 2 GOES TO?
    a. wire-wrap list
    b. signal family list
    c. cable termination list
    d. double-entry wire listing
    double-entry listing
  6. on the digital defensive automatic test equipment (ATE) augmentation equipment (DAAE), the SIGNAL NUMBER column of the double-entry wire list is used to cross-reference with what other list?
    a. wire-wrap
    b. signal name
    c. signal family
    d. cable termination
    signal family
  7. on the digital defensive automatic test equipment (ATE) augmentation equipment (DAAE), which of the following abbreviated test language for all systems (ATLAS) constructs is peculiar to the radio frequency (RF) DAAE only?
    a. DIRECTION-FINDING
    b. PATTERN-GENERATOR
    c. INTERFACE-START
    d. BUS-RESPONSE
    PATTERN-GENERATOR
  8. routing of alternating current (AC) power to line replaceable unit (LRU) power supplies in the radio frequency (RF) module is performed by the
    a. computer assembly
    b. controlled turn-on panel
    c. direct current (DC) power switching unit
    d. microwave signal conditioner
    controlled turn-on panel
  9. the FLAG OUT signal generated by the radio frequency (RF) module controlled turn-on panel assembly
    a. identifies a fault in the power supply sense lines
    b. enables the relays on the power switch driver circuit card assembly (CCA)
    c. tells the computer that one or more direct current (DC) power supplies are enabled
    d. denotes an overload condition in one or more of the DC power supplies
    tells the computer that one or more direct current (DC) power supplies are enabled
  10. the operation that best describes a radio frequency (RF) module direct current (DC) power switching assembly is ita. removes DC power from the RF module when the interface test adapter (ITA) interlock is enabledb. shuts down the DC power supplies when FLAG OUT occursc. routes alternating current (AC) power to the line replaceable unit (LRU) power suppliesd. routes DC power to the test station interface connector assembly (ICA)
    routes DC power to the test station interface connector assembly (ICA)
Author
Anonymous
ID
57285
Card Set
New Text Document.txt
Description
1908896
Updated